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A Charge Parity Ammeter

delete2014-02-17
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OA
AI
N
N. J. Lambert *
E
Edwards, Megan
C
Chiara Ciccarelli
A
A. J. Ferguson
DOI:10.1021/nl403659xdelete
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摘要

摘要

En 中文
A metallic double dot is measured with radio frequency reflectometry. Changes in the total electron number of the double dot are determined via single electron tunnelling contributions to the complex electrical impedance. Electron counting experiments are performed by monitoring the impedance, demonstrating operation of a single electron ammeter without the need for external charge detection.
Keyword:
Single electron devices
Sisyphus impedance
Single electron ammeter
Radiofrequency reflectometry
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期刊

Nano Letters 封面图
Nano Letters
IF:
9.1
论文数:
2.7W
被引数:
16.5W

机构

U
University of Cambridge
学者数:
7.7W
论文数: 7.1W
被引数: 13.7W
引用论文

引用论文

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