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A Defect Detection Algorithm for Optoelectronic Detectors Utilizing GLV-YOLO

delete2025-02-26
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OA
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X
Xinfang Zhao
L
Lyu, Qinghua *
H
Hui Zeng
Z
Zhuoyi Ling
Z
Zhongsheng Zhai
H
Hui Lyu
S
Saffa Riffat
B
Benyuan Chen
W
Wanting Wang
DOI:10.3390/mi16030267delete
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摘要

摘要

En 中文
Photodetectors are indispensable in a multitude of applications, with the detection of surface defects serving as a cornerstone for their production and advancement. To meet the demands of real-time and accurate defect detection, this paper introduces an optimization algorithm based on the GLV-YOLO model tailored for photodetector defect detection in manufacturing settings. The algorithm achieves a reduction in the model complexity and parameter count by incorporating the GhostC3_MSF module. Additionally, it enhances feature extraction capabilities with the integration of the LSKNet_3 attention mechanism. Furthermore, it improves generalization performance through the utilization of the WIoU loss function, which minimizes geometric penalties. The experimental results showed that the proposed algorithm achieved 98.9% accuracy, with 2.1 million parameters and a computational cost of 7.0 GFLOPs. Compared to other methods, our approach outperforms them in both performance and efficiency, fulfilling the real-time and precise defect detection needs of photodetectors.
Keyword:
lightweight model
machine vision
PIN photodiode
surface defect detection
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期刊

Micromachines 封面图
Micromachines
IF:
3
论文数:
1.4W
被引数:
2.9W

机构

U
University of Nottingham
学者数:
3.4W
论文数: 3.2W
被引数: 5.5W
H
Hubei University of Technology
学者数:
8.1K
论文数: 4.7K
被引数: 7.7K
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