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A digital CDS technique and its performance testing
DOI:10.1088/1674-1137/39/7/076101.png)
摘要
En 中文
Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e(-) and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique.
Keyword:
charge-coupled devices
readout noise
correlated double sampling
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期刊
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3.1
论文数:
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被引数:
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