A low-voltage wide-input CMOS comparator for sensor application using back-gate technique

doi:10.1016/j.bios.2003.10.013

2004-07-01

PRE

Yu-Cherng Hung

Bin-Da Liu

DOI：10.1016/j.bios.2003.10.013

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摘要

En 中文

In this paper, two new analog CMOS comparators (Type-I and Type-11) with low-voltage and wide-input capabilities are proposed. The comparator receives two analog inputs and puts out one digital state to identify the larger (or the smaller) of the input variables, which represents an useful operation in data conversion and sensory signal processing. Without using special fabrication technologies, the supply voltage of the circuit is reduced to I V. Due to the utilization of CMOS back-gate technique, the input range of the comparators is greatly improved. The comparators are composed of bulk-driven stage and dynamic latch. By using a CMOS n-well technology, the results of HSPICE simulations indicate that the response time of Type-I circuit is I mus under 10 mV identified resolution. Type-11 comparator achieves 5 mV identified resolution. The input dynamic ranges of the comparators are approximately rail-to-rail, (C) 2004 Elsevier B.V. All rights reserved.

Keyword:

comparator

low-voltage operation

back gate

期刊

Biosensors and Bioelectronics

IF:

10.5

论文数:

1.8W

被引数:

7.7W

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暂无机构信息

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