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A phase retrieval algorithm for shifting illumination
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DOI：10.1063/1.1823034.png)
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Abstract
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We propose a method of iterative phase retrieval that uses measured intensities in the diffraction plane to solve the phase problem in a way that bypasses the problem of lens aberration, leading to greatly improved spatial resolution. This method is stable, easy to implement experimentally, and can be used to view a large area of the specimen when that is desired. (C) 2004 American Institute of Physics.
Keywords:
X-RAY
RESOLUTION
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