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A phase retrieval algorithm for shifting illumination
DOI:10.1063/1.1823034.png)
摘要
En 中文
We propose a method of iterative phase retrieval that uses measured intensities in the diffraction plane to solve the phase problem in a way that bypasses the problem of lens aberration, leading to greatly improved spatial resolution. This method is stable, easy to implement experimentally, and can be used to view a large area of the specimen when that is desired. (C) 2004 American Institute of Physics.
Keyword:
X-RAY
RESOLUTION
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期刊
IF:
3.6
论文数:
10.4W
被引数:
17.8W
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引用论文
Electronic and optoelectronic properties of van der Waals heterostructure based on graphene-like GaN, blue phosphorene, SiC, and ZnO: A first principles study基于类石墨烯GaN,蓝色磷烯,SiC和ZnO的范德华异质结构的电子和光电性质: 第一性原理研究
Phase recovery and lensless imaging by iterative methods in optical, X-ray and electron diffraction通过光学,x射线和电子衍射中的迭代方法进行相位恢复和无透镜成像
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