A versatile computer-controlled high-resolution LBIC system

doi:10.1002/pip.528

2004-03-16

PRE

Joaquín Martín‐Calleja *

Concha Fernández‐Lorenzo

J. A. Poce‐Fatou

Rodrigo Alcántara

DOI：10.1002/pip.528

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摘要

En 中文

This paper presents the design of versatile equipment for obtaining laser-beam-induced current (LBIC) images which allows the study of large surfaces as well as conversion areas of a few micrometers. The modular optomechanical design enables the user to modify the size of the irradiation spot by simply changing the microscope objective used as focal lens, albeit within the limits set by the wavelength. The use of an appropriate calculation algorithm makes it possible to rely on a computerized system to adjust the distance at which the focusing lens must be placed with respect to the sample plane. The possibility of working at micrometer resolution allows one to obtain very significant information for the study of irregularities, manufacturing defects, impurities, grain boundaries, dislocations, recombination centers, etc. in photovoltaic wafers. Copyright (C) 2004 John Wiley Sons, Ltd.

Keyword:

LBIC

high resolution

computerized system

OBIC

solar cell