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Active learning with label quality control
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DOI：10.7717/peerj-cs.1480.png)
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Abstract
En 中文
Training deep neural networks requires a large number of labeled samples, which are typically provided by crowdsourced workers or professionals at a high cost. To obtain qualified labels, samples need to be relabeled for inspection to control the quality of the labels, which further increases the cost. Active learning methods aim to select the most valuable samples for labeling to reduce labeling costs. We designed a practical active learning method that adaptively allocates labeling resources to the most valuable unlabeled samples and the most likely mislabeled labeled samples, thus significantly reducing the overall labeling cost. We prove that the probability of our proposed method labeling more than one sample from any redundant sample set in the same batch is less than 1/k, where k is the number of the k-fold experiment used in the method, thus significantly reducing the labeling resources wasted on redundant samples. Our proposed method achieves the best level of results on benchmark datasets, and it performs well in an industrial application of automatic optical inspection.
Keywords:
Active learning
Automated optical inspection
Label quality control
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