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Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification

delete2023-03-02
delete23
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OA
AI
N
Nathan J. Szymanski
C
Christopher J. Bartel
Y
Yan Zeng
M
Mouhamad Diallo
H
Haegyeom Kim
G
Gerbrand Ceder *
DOI:10.1038/s41524-023-00984-ydelete
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摘要

摘要

En 中文
Machine learning (ML) has become a valuable tool to assist and improve materials characterization, enabling automated interpretation of experimental results with techniques such as X-ray diffraction (XRD) and electron microscopy. Because ML models are fast once trained, there is a key opportunity to bring interpretation in-line with experiments and make on-the-fly decisions to achieve optimal measurement effectiveness, which creates broad opportunities for rapid learning and information extraction from experiments. Here, we demonstrate such a capability with the development of autonomous and adaptive XRD. By coupling an ML algorithm with a physical diffractometer, this method integrates diffraction and analysis such that early experimental information is leveraged to steer measurements toward features that improve the confidence of a model trained to identify crystalline phases. We validate the effectiveness of an adaptive approach by showing that ML-driven XRD can accurately detect trace amounts of materials in multi-phase mixtures with short measurement times. The improved speed of phase detection also enables in situ identification of short-lived intermediate phases formed during solid-state reactions using a standard in-house diffractometer. Our findings showcase the advantages of in-line ML for materials characterization and point to the possibility of more general approaches for adaptive experimentation.

期刊

npj Computational Materials 封面图
npj Computational Materials
IF:
11.9
论文数:
2.4K
被引数:
1.7W

机构

U
University of California Berkeley
学者数:
3.5W
论文数: 2.8W
被引数: 11.3W
University of California System 封面图
University of California System
学者数:
37.7W
论文数: 33.8W
被引数: 6.6K
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