1
Return

An Automatic Analog Instrument Reading System Using Computer Vision and Inspection Robot

delete2020-09-01
delete39
PRE
AI
J
Jian Huang
J
Jun-Zhe Wang
谭毅华 (Yihua Tan) *
D
Dongrui Wu
Y
Yu Cao
DOI:10.1109/TIM.2020.2967956delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
Since the manual inspection of analog instruments is inefficient, many computer vision-based automatic reading systems have been proposed recently. However, most of them use fixed cameras that are costly due to a large number of used cameras. Although some other systems adopting the pan-tilt-zoom camera and the movable inspection robot can avoid using many cameras, they have to overcome high computational cost in aligning the camera to the tested instrument. Meanwhile, most existing systems are instrument type-dependent and, hence, cannot handle multiple types of instruments simultaneously. In this article, first, based on an inspection robot, an automatic reading system equipped with a pan-tilt-zoom camera is designed for different types of round-shape analog instruments. Then, a fast camera alignment algorithm based on visual servo is proposed, in which YOLOv3 is applied and improved to locate the instrument and guide the camera to iteratively align with the instrument. Finally, a monocular-vision pointer reconstruction algorithm is proposed to accurately read the instrument. Experimental results demonstrated that our proposed system is fast and reliable in the camera-alignment process and is effective in reading different types of analog instruments during the robot-based inspection.
Keywords:
Instruments
Cameras
Robot vision systems
Inspection
Navigation
Detectors
Analog instrument
automatic reading system
fast camera alignment
monocular-vision pointer reconstruction
robot-based inspection
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

IEEE Transactions on Instrumentation and Measurement cover
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
Papers:
1.9W
Citations:
5.8W

Organization

No organization information available
Cited Papers

Cited Papers

Citing Papers

Citing Papers