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An edge dislocation interacting with a slightly wavy interface
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DOI：10.1016/S0020-7225(02)00115-5.png)
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En 中文
The undulant interface of a bi-material, which is due to manufacturing or instability under high stress, may provide certain preferred places where microdefects accumulate. In the present paper, an edge dislocation near a slightly wavy interface is studied via a regular perturbation scheme. Stress investigation for the interaction between the edge dislocation and the wavy bi-material interface has been carried out. The Peach-Koehler force on the dislocation is calculated from the first perturbed solution of the stress fields. The influence of several key parameters, such as the Dundurs bi-material interface constants alpha, beta, the distance of the dislocation to the interface, the wavy extent of the interface, etc., on the behavior of the dislocation has been analyzed. The numerical examples indicate that there are certain equilibrium points around which the dislocations are expected to be accumulated. In turn, microdefects, such as microcracks and microvoids, may be initiated near these sites. Results obtained can be applied to study crack initiation or delamination along bonded bi-material interfaces. (C) 2002 Published by Elsevier Science Ltd.
Keyword:
edge dislocation
wavy interface
perturbation
stress analysis
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