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Atomic force microscopy with qPlus sensors
DOI:10.1557/s43577-023-00654-w.png)
摘要
En 中文
Atomic force microscopy is one of the most important tools in nanoscience. It employs an atomic probe that can resolve surfaces with atomic and subatomic spatial resolution and manipulate atoms. The qPlus sensor is a quartz-based self-sensing cantilever with a high stiffness that, in contrast to Si cantilevers, allows to oscillate at atomic radius amplitudes in the proximity of reactive surfaces and thus provides a high spatial resolution. This article reports on the development of this sensor and discusses applications in materials research.
Keyword:
Crystallographic structure
Microelectromechanical systems (MEMS)
Quantum effects
Scanning probe microscopy (SPM)
Sensor
Surface chemistry
期刊
IF:
4.9
论文数:
5.3K
被引数:
9.5K
机构
引用论文
On-Surface Synthesis and Characterization of 9-Atom Wide Armchair Graphene Nanoribbons9原子宽扶手椅型石墨烯纳米带的表面合成与表征
ACS NANO
IF16

