Automatic indexing of rotation diffraction patterns

doi:10.1107/s0021889887009737

Automatic indexing of rotation diffraction patterns

1988-02-01

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DOI：10.1107/s0021889887009737

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A method is described which assigns indices to a set of single-crystal reflections recorded by the rotation-oscillation technique using a fixed X-ray wavelength. It is assumed that the space group and approximate unit-cell parameters are known. The unknown crystal orientation is determined directly from the observed diffraction pattern of one or several oscillation data records. A local indexing procedure is described which tolerates large initial errors in the parameters controlling the diffraction pattern. These parameters are refined subsequently, thereby satisfying the constraints imposed by the space-group symmetry.

Automatic indexing of rotation diffraction patterns

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