arrow
返回

BAD: A Blockchain Anomaly Detection Solution

delete2020-01-01
delete28
delete
OA
AI
M
Matteo Signorini
M
Matteo Pontecorvi
W
Waël Kanoun
R
Roberto Di Pietro *
DOI:10.1109/ACCESS.2020.3025622delete
delete原文链接
delete分享
delete收藏
查看原文
摘要

摘要

En 中文
Anomaly detection tools play a role of paramount importance in protecting networks and systems from unforeseen attacks, usually by automatically recognizing and filtering out anomalous activities. Over the years, different approaches have been designed, all focused on lowering the false positive rate. However, no proposal has addressed attacks specifically targeting blockchain-based systems. In this paper, we present BAD: Blockchain Anomaly Detection. This is the first solution, to the best of our knowledge, that is tailored to detect anomalies in blockchain-based systems. BAD is a complete framework, relying on several components leveraging, at its core, blockchain meta-data in order to collect potentially malicious activities. BAD enjoys some unique features: (i) it is distributed (thus avoiding any central point of failure); (ii) it is tamper-proof (making it impossible for a malicious software to remove or to alter its own traces); (iii) it is trusted (any behavioral data is collected and verified by the majority of the network); and, (iv) it is private (avoiding any third party to collect/analyze/store sensitive information). Our proposal is described in detail and validated via both experimental results and analysis, that highlight the quality and viability of our Blockchain Anomaly Detection solution.
Keyword:
Blockchain technology
security
intrusion detection systems
distributed systems
AI总结

AI总结

对已上传原文的论文进行重点信息的提取,主要内容包括:简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。

期刊

IEEE Access 封面图
IEEE Access
IF:
3.6
论文数:
9.8W
被引数:
29.4W

机构

H
Hamad Bin Khalifa University-Qatar
学者数:
2.2K
论文数: 2.0K
被引数: 33
Q
qatar foundation (qf)
学者数:
6.3K
论文数: 7.0K
被引数: 8
N
nokia corporation
学者数:
1.8K
论文数: 1.5K
被引数: 1
学者 查看更多机构
引用论文

引用论文

A Transmission Electron Microscopy Study of Process‐Induced Defects in Submicron SOI Structures
err2019-12-07
err0
PREAI
errN. David Theodore; Susanne C. Arney; C. Barry Carter; Noel C. MacDonald
err分享
err收藏
err分享
err收藏
学者 查看更多内容