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Bayesian Multi-line Intensity Mapping
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DOI：10.3847/1538-4357/ad57b9.png)
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摘要
En 中文
Line intensity mapping (LIM) has emerged as a promising tool for probing the 3D large-scale structure through the aggregate emission of spectral lines. The presence of interloper lines poses a crucial challenge in extracting the signal from the target line in LIM. In this work, we introduce a novel method for LIM analysis that simultaneously extracts line signals from multiple spectral lines, utilizing the covariance of native LIM data elements defined in the spectral-angular space. We leverage correlated information from different lines to perform joint inference on all lines simultaneously, employing a Bayesian analysis framework. We present the formalism, demonstrate our technique with a mock survey setup resembling the SPHEREx deep-field observation, and consider four spectral lines within the SPHEREx spectral coverage in the near-infrared: H alpha, [O-III], H beta, and [O-II]. We demonstrate that our method can extract the power spectrum of all four lines at the greater than or similar to 10 sigma level at z < 2. For the brightest line, H alpha, the 10 sigma sensitivity can be achieved out to z similar to 3. Our technique offers a flexible framework for LIM analysis, enabling simultaneous inference of signals from multiple line emissions while accommodating diverse modeling constraints and parameterizations.
Keyword:
C-II EMISSION
LARGE-SCALE STRUCTURE
STAR-FORMATION RATE
POWER SPECTRUM
CROSS-CORRELATION
LUMINOSITY FUNCTION
MOLECULAR GAS
COSMOLOGICAL CONSTRAINTS
INTERLOPER CONTAMINATION
ALPHA EMISSION
期刊
IF:
5.4
论文数:
8.3W
被引数:
32.0W
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