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Binary test design problem

delete2018-07-01
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PRE
AI
V
Vladimir Turetsky
D
David M. Steinberg
E
Emil Bashkansky *
DOI:10.1016/j.measurement.2018.02.031delete
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摘要

摘要

En 中文
Unlike in traditional measurement methods, in binary testing each test item provides only one bit of information. In view of limited test resources, effective planning of the test is crucial. In this article, the general problem is formulated from the metrological point of view for a high variety of objects under test and a homogeneous item response function. Different optimization criteria are reviewed for one-item testing (single and replicated), and their advantages and disadvantages are discussed. The article concludes with preliminary recommendations for how to plan a binary test.
Keyword:
Binary test
Ability
Difficulty
Optimization criteria
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Measurement 封面图
Measurement
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5.6
论文数:
2.0W
被引数:
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机构

B
Braude Academic College of Engineering
学者数:
268
论文数: 292
被引数: 0
T
Tel Aviv University
学者数:
3.7W
论文数: 3.0W
被引数: 3.6W
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