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期刊

Microscopy and Microanalysis 封面图
Microscopy and Microanalysis
IF:
3
论文数:
2.5K
被引数:
6.2K

机构

U
university of florida
学者数:
1.2K
论文数: 490
被引数: 0
引用论文

引用论文

Focused ion beam milling of exfoliated graphene for prototyping of electronic devices
errMicroelectronic Engineering
IF0
err2012-10-01
err0
PREAI
errMarek E. Schmidt; Zaharah Johari; Razali Ismail; Hiroshi Mizuta; Harold M.H. Chong
err分享
err收藏
Sub-5nm FIB direct patterning of nanodevices
errMicroelectronic Engineering
IF0
err2007-05-01
err0
PREAI
errJ. Gierak; A. Madouri; A.L. Biance; E. Bourhis; G. Patriarche; C. Ulysse; D. Lucot; X. Lafosse; L. Auvray; L. Bruchhaus; R. Jede
err分享
err收藏
Precision cutting and patterning of graphene with helium ions
errNanotechnology
IF0
err2009-10-13
err0
errOAAI
errD C Bell; M C Lemme; L A Stern; J R Williams; C M Marcus
err分享
err收藏
Ion beam modification of two-dimensional materials: Characterization, properties, and applications
errAPPLIED PHYSICS REVIEWS
IF11.6
err2017-03-01
err192
PREAI
errLi, Ziqi; Chen, Feng
err分享
err收藏
Supported Two-Dimensional Materials under Ion Irradiation: The Substrate Governs Defect Production
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2018-08-17
err89
errOAAI
errKretschmer, Silvan; Maslov, Mikhail; Ghaderzadeh, Sadegh; Ghorbani-Asl, Mahdi; Hlawacek, Gregor; Krasheninnikov, Arkady V.
err分享
err收藏
Ordered anodic alumina nanochannels on focused-ion-beam-prepatterned aluminum surfaces
errAPPLIED PHYSICS LETTERS
IF3.6
err2001-01-01
err163
PREAI
errLiu, CY; Datta, A; Wang, YL
err分享
err收藏
Rapid Focused Ion Beam Milling Based Fabrication of Plasmonic Nanoparticles and Assemblies via Sketch and Peel Strategy
errACS NANO
IF16
err2016-11-23
err128
PREAI
errChen, Yiqin; Bi, Kaixi; Wang, Qianjin; Zheng, Mengjie; Liu, Qing; Han, Yunxin; Yang, Junbo; Chang, Shengli; Zhang, Guanhua; Duan, Huigao
err分享
err收藏
Nano Josephson superconducting tunnel junctions in YBa2Cu3O7-δ directly patterned with a focused helium ion beam
errNATURE NANOTECHNOLOGY
IF34.9
err2015-04-27
err171
PREAI
errCybart, Shane A.; Cho, E. Y.; Wong, T. J.; Wehlin, Bjoern H.; Ma, Meng K.; Huynh, Chuong; Dynes, R. C.
err分享
err收藏
Focused ion beam micro- and nanoengineering
errMRS BULLETIN
IF4.9
err2011-01-31
err97
PREAI
errLangford, Richard M.; Nellen, Philipp M.; Gierak, Jacques; Fu, Yongqi
err分享
err收藏
Recent developments in nanofabrication using focused ion beams使用聚焦离子束进行纳米加工的最新进展
errSMALL
IF12.1
err2005-09-02
err369
PREAI
errTseng, AA
err分享
err收藏
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