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Cantilever effects on electrostatic force gradient microscopy
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DOI：10.1063/1.1797539.png)
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The effects of the cantilever on electrostatic force microscopy are discussed. Numerical calculations of the electrostatic potential distribution and force gradient for typical experimental geometries are presented. A simple analytical relation between the calculated force gradients with and without cantilever is found. The main effect of the cantilever is to reduce the electric field in the tip-sample gap and, as a consequence, the force gradient can be strongly reduced. This effect can be very important for dielectric films while it can be neglected for metallic samples. (C) American Institute of Physics.
Keyword:
DNA-MOLECULES
TIP-SHAPE
RESOLUTION
SURFACE
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3.6
论文数:
10.4W
被引数:
17.8W
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Resolution enhancement and improved data interpretation in electrostatic force microscopy -: art. no. 245403.png)
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