返回
Cellular automata-based recursive pseudoexhaustive test pattern generator
DOI:10.1109/12.908993.png)
摘要
En 中文
This paper presents a recursive technique for generation of pseudoexhaustive test patterns. The scheme is optimal in the sense that the first 2(k) vectors cover all adjacent k-bit spaces exhaustively. It requires substantially lesser hardware than the existing methods and utilizes the regular, modular, and cascadable structure of local neighborhood Cellular Automata (CA), which is ideally suited for VLSI implementation. In terms of XOR gates, this approach outperforms earlier methods by 15 to 50 percent. Moreover, test effectiveness and hardware requirements have been established analytically, rather than by simple simulation and logic minimization.
Keyword:
data path architecture
pseudoexhaustive testing
BIST
cellular automata
期刊
IF:
3.8
论文数:
5.4K
被引数:
9.8K
机构
暂无机构信息
引用论文
Site‐Specific Labelling of Native Mammalian Proteins for Single‐Molecule FRET Measurements
ChemBioChem
IF0
Synergistic anti-oxidative/anti-inflammatory treatment for acute lung injury with selenium based chlorogenic acid nanoparticles through modulating Mapk8ip1/MAPK and Itga2b/PI3k-AKT axis基于硒的绿原酸纳米颗粒通过调控Mapk8ip1/MAPK和Itga2b/PI3k-AKT轴对急性肺损伤的协同抗氧化/抗炎治疗

