返回
Center-environment feature models for materials image segmentation based on machine learning
DOI:10.1038/s41598-022-16824-w.png)
摘要
En 中文
Materials properties depend not only on their compositions but also their microstructures under various processing conditions. So far, the analyses of complex microstructure images rely mostly on human experience, lack of automatic quantitative characterization methods. Machine learning provides an emerging vital tool to identify various complex materials phases in an intelligent manner. In this work, we propose a center-environment segmentation (CES) feature model for image segmentation based on machine learning method with environment features and the annotation input of domain knowledge. The CES model introduces the information of neighbourhood as the features of a given pixel, reflecting the relationships between the studied pixel and its surrounding environment. Then, an iterative integrated machine learning method is adopted to train and correct the image segmentation model. The CES model was successfully applied to segment seven different material images with complex texture ranging from steels to woods. The overall performance of the CES method in determining boundary contours is better than many conventional methods in the case study of the segmentation of steel image. This work shows that the iterative introduction of domain knowledge and environment features improve the accuracy of machine learning based image segmentation for various complex materials microstructures.
AI总结
对已上传原文的论文进行重点信息的提取,主要内容包括:简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。
期刊
IF:
3.9
论文数:
27.8W
被引数:
83.5W
机构
引用论文
Electrochemically assisted micro localized grafting of aptamers in a microchannel engraved in fluorinated thermoplastic polymer Dyneon THV
RSC Advances
IF0
Commentary: The Materials Project: A materials genome approach to accelerating materials innovation评论: 材料项目: 加速材料创新的材料基因组方法
APL MATERIALS
IF4.5
Evaluation of charge transfer resistance by geometrical extrapolation of the centre of semicircular impedance diagrams通过半圆阻抗图中心的几何外推法评估电荷转移电阻

