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Characterizing microring resonators using optical frequency domain reflectometry
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DOI：10.1364/OL.425681.png)
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A novel, to the best of our knowledge, method to extract optical microring resonators' loss characteristics is proposed and demonstrated using optical frequency domain reflectometry (OFDR). Compared with the traditional optical transmission measurement method, the spatial-resolved backscattering optical signals obtained from the OFDR can clearly show the resonance mode's increased optical path length due to its circulation inside the resonator. By further processing the backscattered optical signals, loaded Q-factors of several resonators can be accurately determined. A calculation model is proposed to derive the resonance mode's intrinsic Q-factor from OFDR measurements of a series of loaded resonators. (C) 2021 Optical Society of America
Keyword:
SILICON
MICROCAVITY
MICROSPHERE
期刊
IF:
3.3
论文数:
4.0W
被引数:
7.6W
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引用论文
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