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Characterizing percolative materials by straining

delete2019-01-01
delete13
PRE
AI
H
Heming Yao
M
Marek Hempel
Y
Ya‐Ping Hsieh
J
Jing Kong
M
Mario Hofmann *
DOI:10.1039/c8nr09120jdelete
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摘要

摘要

En 中文
Carrier transport in a wide range of nanomaterial assemblies proceeds by percolation through discontinuous networks of constituents. Improving percolative nanomaterials could enhance transparent conductors, sensors, and electronic devices. A significant obstacle in optimizing percolative materials is the challenge in their characterization. The critical connection pathways which determine a percolative material's conductivity are not easily accessible with existing metrology tools and traditional investigation approaches rely on indirect methods based on many samples and on simplifying assumptions. We here demonstrate the direct extraction of characteristic parameters from a single sample by analyzing the strain-dependent resistance of percolative materials. An analytical model is derived that can explain experimental data for various percolative materials, morphologies, and straining conditions. The relationship of the extracted parameters with previously introduced figures of merit allows us to compare nanostructures of diverse dimensionalities and compositions for applications such as strain gauges and transparent conductors.
Keyword:
NANOTUBE FILMS
TRANSPARENT
GRAPHENE
COMPOSITES
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期刊

Nanoscale 封面图
Nanoscale
IF:
5.1
论文数:
3.0W
被引数:
11.6W

机构

U
University of Hong Kong
学者数:
4.1W
论文数: 3.9W
被引数: 10.1W
A
academia sinica - taiwan
学者数:
1.9W
论文数: 1.6W
被引数: 17
N
National Taiwan University
学者数:
4.7W
论文数: 4.2W
被引数: 3.6W
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引用论文

引用论文

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errHempel, Marek; Nezich, Daniel; Kong, Jing; Hofmann, Mario
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Size Effects and the Problem with Percolation in Nanostructured Transparent Conductors纳米结构透明导体的尺寸效应和渗滤问题
err2010-12-06
err309
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errDe, Sukanta; King, Paul J.; Lyons, Philip E.; Khan, Umar; Coleman, Jonathan N.
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Transport exponent in a three-dimensional continuum tunneling-percolation model
err2008-05-29
err100
PREAI
errJohner, N.; Grimaldi, C.; Balberg, I.; Ryser, P.
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