.png){kind=icon}
返回
Circuit Reliability Comparison Between Stochastic Computing and Binary Computing
.png){kind=icon}
PRE
AI
DOI：10.1109/TCSII.2020.2993273.png)
.png){kind=icon}
原文求助.png){kind=icon}
分享.png){kind=icon}
收藏
摘要
En 中文
Reliability-enhanced circuit design is increasingly demanded due to severer transistor aging and variations at nanoscale. In this brief, new insights of inherently enhancing reliability are presented, based on the emerging computing paradigm of stochastic computing (SC). A new cross-layer reliability simulation flow supporting statistical static timing analysis (SSTA) is proposed, with a new long-term compact transistor aging model validated by 16/14nm FinFET experimental data. Then, the reliability of SC circuits in practical applications is investigated and compared with that of conventional binary circuits, for the first time. The results indicate that, the performance of SC circuits is intrinsically resistant to aging and variations ascribed to the circuit topology and the probability encoding. It suggests that, SC can provide more relaxed circuit design margins, offering promises to the application of emerging nanodevices in the future.
Keyword:
Aging
Integrated circuit reliability
Integrated circuit modeling
Stochastic processes
Transistors
Computational modeling
Reliability-enhanced design
NBTI
stochastic computing
reliability simulation
FinFET
frequency guardband
AI总结
对已上传原文的论文进行重点信息的提取，主要内容包括：简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。
期刊
I
IF:
4.9
论文数:
8.8K
被引数:
2.5W
机构
引用论文
分享收藏Mycobacterium bovis Bacillus Calmette-Guérin (BCG) stimulates human beta-defensin-2 gene transcription in human epithelial cellsMycobacterium bovis Bacillus Calmette-Guérin (BCG) 刺激人上皮细胞中人类β-防御素-2基因的转录.png)
IF0
PREAI
分享收藏A Preliminary Investigation into Separating Performance and Magnetic Field Characteristic Analysis Based on a Novel MatrixMinerals
OAAI
MineralsIF0
OAAI分享收藏分享收藏
查看更多内容