Return
Class-relevant patch embedding selection for few-shot image classification
DOI:10.1016/j.imavis.2026.106031.png)
Abstract
En 中文
• We address background interference in few-shot learning without localization and alignment. • We present CPES, selecting class-relevant patch embeddings by evaluating their similarity to class embeddings. • We explore various methods for patch embedding selection, and adopt top-ranked class-relevant patch embeddings. • Our approach enhances existing patch embedding metrics and boosts their performance. • Visualizations and extensive experiments showcase the superiority of our method.
Keywords:
few-shot learning
patch embedding selection
class-relevant embeddings
image classification
background interference
Journal
IF:
4.2
Papers:
4.0K
Citations:
6.7K

