.png){kind=icon}
返回
Combinational Logic Analysis Using Laser Voltage Probing
.png){kind=icon}
PRE
AI
DOI：10.31399/asm.cp.istfa2015p0035.png)
.png){kind=icon}
.png){kind=icon}
分享.png){kind=icon}
收藏
摘要
En 中文
Abstract
Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed from combinational circuitries and use it to rebuild the truth table.
期刊
暂无期刊信息
机构
暂无机构信息
引用论文
暂无论文信息