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Common-reflection-surface-based prestack diffraction separation and imaging
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DOI：10.1190/GEO2016-0445.1.png)
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摘要
En 中文
Diffraction imaging can lead to high-resolution characterization of small-scale subsurface structures. A key step of diffraction imaging and tomography is diffraction separation and enhancement, especially in the full prestack data volume. We have considered point diffractors and developed a robust and fully data-driven workflow for prestack diffraction separation based on wavefront attributes, which are determined using the common-reflection-surface (CRS) method. In the first of two steps, we apply a zero-offset-based extrapolation operator for prestack diffraction separation, which combines the robustness and stability of the zero-offset CRS processing with enhanced resolution and improved illumination of the finite-offset CRS processing. In the second step, when the finite-offset diffracted events are separated, we apply a diffraction-based time migration velocity model building that provides high-quality diffraction velocity spectra. Applications of the new workflow to 2D/3D complex synthetic data confirm the superiority of prestack diffraction separation over the post-stack method as well as the high potential of diffractions for improved time imaging.
Keyword:
CRS STACK
ATTRIBUTES
ENHANCEMENT
OFFSET
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