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Computed laminography for materials testing
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DOI：10.1063/1.115771.png)
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摘要
En 中文
We have developed a computed laminography system for the inspection of large or flat objects using x rays. By this new laminographic method only a translation of the object is necessary. Both the x-ray source and the detector remain stationary. Object cross sections are reconstructed from digital projections taken during the object motions and for the reconstruction well-known algorithms are used. By use of a microfocus x-ray tube and a line detector, objects can be inspected with a slice resolution of about 50 mu m independent of he object size. (C) 1996 American Institute of Physics.
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