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Contrast-enhanced phase-resolved second harmonic generation microscopy
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DOI：10.1364/OL.520814.png)
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The characterization of inverted structures (crystallographic, ferroelectric, or magnetic domains) is crucial in the development and application of novel multi -state devices. However, determining these inverted structures needs a sensitive probe capable of revealing their phase correlation. Here a contrast -enhanced phase -resolved second harmonic generation (SHG) microscopy is presented, which utilizes a phase -tunable Soleil-Babinet compensator and the interference between the SHG fields from the inverted structures and a homogeneous reference. By this means, such inverted structures are correlated through the it -phase difference of SHG, and the phase difference is ultimately converted into the intensity contrast. As a demonstration, we have applied this microscopy in two scenarios to determine the inverted crystallographic domains in two-dimensional van der Waals material MoS 2 . Our method is particularly suitable for applying in vacuum and cryogenic environments while providing optical diffraction -limited resolution and arbitrarily adjustable contrast. Without loss of generality, this contrastenhanced phase -resolved SHG microscopy can also be used to resolve other non-centrosymmetric inverted structures, e.g. ferroelectric, magnetic, or multiferroic phases. (c) 2024 Optica Publishing Group
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3.3
论文数:
4.0W
被引数:
7.6W
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