Dark-field optical coherence microscopy

doi:10.1364/OL.35.003489

2010-10-13

PRE

Martin Villiger *

Christophe Pache

Theo Lasser

DOI：10.1364/OL.35.003489

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摘要

En 中文

Dark-field illumination is known to enhance scattering contrast in optical microscopy. We combined this concept with Fourier domain optical coherence microscopy (OCM). The detection and illumination paths are decoupled, and only the scattered light originating from the sample generates the tomogram signal, whereas any specular reflection is highly suppressed. We analyze and discuss this dark-field OCM concept and present its superior imaging quality on live cell samples. (C) 2010 Optical Society of America

Keyword:

PHASE MICROSCOPY

TOMOGRAPHY

AI总结

对已上传原文的论文进行重点信息的提取，主要内容包括：简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。

期刊

Optics Letters

IF:

3.3

论文数:

4.0W

被引数:

7.6W

机构

swiss federal institutes of technology domain

学者数:

9.0W

论文数: 8.0W

被引数: 163

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