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Deep-Learning-Enabled Automatic Optical Inspection for Module-Level Defects in LCD
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DOI：10.1109/JIOT.2021.3079440.png)
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Abstract
En 中文
Liquid crystal display (LCD) defects detection on module level is increasingly important for flat-panel displays (FPD) industry to increase the production capacity via machine vision technology. However, it is an overwhelmingly challenging issue due to various difficulties. This article discloses a practical automatic optical inspection (AOI) system consisting of hardware structure and software algorithm to detect module-level defects. The AOI system is the core component to build a distributed integrated inspection system with the help of the Internet of Things (IoT). Starting from the analysis of the challenges encountered in module-level defects inspection, a delicate photograph scheme is proposed to reveal different kinds of defects. In order to robustly work on the module-level defects detection with complex situations, a novel framework based on YOLOV3 detection unit is proposed in this article, including the preprocessing module, detection module, defects definition module, and interferences elimination module. To the best of our knowledge, this is the first work that designs a practical AOI system for module-level defects detection. In order to demonstrate the effectiveness of the proposed method, extensive experiments have been conducted on the manufacturing lines. The evaluation of the detection performance of the AOI system in comparison with a manual scheme indicates that the proposed system is practical for module-level defects detection. Currently, the proposed system has been deployed in a real-world LCD manufacturing line from a major player in the world.
Keywords:
Liquid crystal displays
Deep learning
Internet of Things
Thin film transistors
Object detection
Automatic optical inspection
Smart manufacturing
Automatic optical inspection (AOI)
deep learning
liquid crystal display (LCD)
smart manufacturing
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