DeepCPDP: Deep Learning Based Cross-Project Defect Prediction

doi:10.1109/ACCESS.2019.2961129

2019-01-01

DOI：10.1109/ACCESS.2019.2961129

原文链接

查看原文

摘要

En 中文

Cross-project defect prediction (CPDP) is an active research topic in the domain of software defect prediction, since CPDP can be applied to the following scenarios: the target project for software defect prediction is a new project or the target project does not have enough labeled modules. Most of the previous work tried to utilize the labeled dataset gathered from other projects (i.e., the source projects) and then proposed transfer learning based methods to reduce the data distribution difference between different projects. In this article, we propose a deep learning based CPDP method DeepCPDP. For this method, we represent source code of each extracted program module by using simplified abstract syntax tree (SimAST). For a node of SimAST, we only keep its node type, since this is project-independent, while we ignore the name of method and variable, since these information are project-specific. Therefore, SimAST is project-independent and especially suitable for the task of CPDP. Then, we extract the token vector from each module after it is modeled via SimAST. Moreover, we design a new unsupervised based embedding method SimASTToken2Vec to learn meaningful representation for these extracted token vectors. Later, we employ Bi-directional Long Short-Term Memory (BiLSTM) neural network to automatically learn semantic features from embedded token vectors. In addition, we use attention mechanism over the BiLSTM layer to learn the weight of the vectors from the learned semantic features. Finally, we construct CPDP models via Logistic regression classifier. To show the effectiveness of DeepCPDP, ten large-scale projects from different application domains are used and AUC measure is used to measure the prediction performance of trained models. By using Scott-Knott test, we can find DeepCPDP can significantly outperform eight state-of-the-art baselines. Moreover, we also verify that the usage of SimASTToken2Vec, BiLSTM and attention mechanism is competitive in our proposed method.

Keyword:

Software defect prediction

cross-project defect prediction

bi-directional long short-term memory

embedding method

attention mechanism