arrow
返回

Degradation Data Analysis Using Wiener Processes With Measurement Errors

delete2013-12-01
delete337
PRE
AI
Z
Zhi‐Sheng Ye *
王钰 封面图
王钰 (Yu Wang)
K
Kwok‐Leung Tsui
M
Michael Pecht
DOI:10.1109/TR.2013.2284733delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
Degradation signals that reflect a system's health state are important for diagnostics and health management of complex systems. However, degradation signals are often compounded and contaminated by measurement errors, making data analysis a difficult task. Motivated by the wear problem of magnetic heads used in hard disk drives (HDDs), this paper investigates Wiener processes with measurement errors. We explore the traditional Wiener process with positive drifts compounded with i.i.d. Gaussian noises, and improve its estimation efficiency compared with the existing inference procedure. Furthermore, to capture the possible heterogeneity in a population, we develop a mixed effects model with measurement errors. Statistical inferences of this model are discussed. The mixed effects model subsumes several existing Wiener processes as its limiting cases, and thus it is useful for suggesting an appropriate Wiener process model for a specific dataset. The developed methodologies are then applied to the wear problem of magnetic heads of HDDs, and a light intensity degradation problem of light-emitting diodes.
Keyword:
Embedded model
random effects
wear data
AI总结

AI总结

对已上传原文的论文进行重点信息的提取,主要内容包括:简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。

期刊

IEEE Transactions on Reliability 封面图
IEEE Transactions on Reliability
IF:
5.7
论文数:
2.8K
被引数:
8.5K

机构

C
City University of Hong Kong
学者数:
2.3W
论文数: 3.0W
被引数: 6.1W
University System of Maryland 封面图
University System of Maryland
学者数:
6.5W
论文数: 5.6W
被引数: 113
引用论文

引用论文

err分享
err收藏
err分享
err收藏
Facile and straightforward synthesis of superparamagnetic reduced graphene oxide–Fe3O4hybrid composite by a solvothermal reaction
err2012-12-10
err0
PREAI
errYue-Wen Liu; Meng-Xue Guan; Lan Feng; Shun-Liu Deng; Jian-Feng Bao; Su-Yuan Xie; Zhong Chen; Rong-Bin Huang; Lan-Sun Zheng
err分享
err收藏
err分享
err收藏
学者 查看更多内容