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Depth Edge Filtering Using Parameterized Structured Light Imaging
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DOI：10.3390/s17040758.png)
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摘要
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This research features parameterized depth edge detection using structured light imaging that exploits a single color stripes pattern and an associated binary stripes pattern. By parameterized depth edge detection, we refer to the detection of all depth edges in a given range of distances with depth difference greater or equal to a specific value. While previous research has not properly dealt with shadow regions, which result in double edges, we effectively remove shadow regions using statistical learning through effective identification of color stripes in the structured light images. We also provide a much simpler control of involved parameters. We have compared the depth edge filtering performance of our method with that of the state-of-the-art method and depth edge detection from the Kinect depth map. Experimental results clearly show that our method finds the desired depth edges most correctly while the other methods cannot.
Keyword:
depth edge filter
depth detection
structured light
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IF:
3.5
论文数:
7.2W
被引数:
20.9W
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A state of the art in structured light patterns for surface profilometry.png)
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