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Depth-enhanced high-throughput microscopy by compact PSF engineering
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DOI：10.1038/s41467-024-48502-y.png)
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Abstract
En 中文
High-throughput microscopy is vital for screening applications, where three-dimensional (3D) cellular models play a key role. However, due to defocus susceptibility, current 3D high-throughput microscopes require axial scanning, which lowers throughput and increases photobleaching and photodamage. Point spread function (PSF) engineering is an optical method that enables various 3D imaging capabilities, yet it has not been implemented in high-throughput microscopy due to the cumbersome optical extension it typically requires. Here we demonstrate compact PSF engineering in the objective lens, which allows us to enhance the imaging depth of field and, combined with deep learning, recover 3D information using single snapshots. Beyond the applications shown here, this work showcases the usefulness of high-throughput microscopy in obtaining training data for deep learning-based algorithms, applicable to a variety of microscopy modalities. Implementing point spread function (PSF) engineering in high-throughput microscopy has proved challenging. Here, the authors propose a compact PSF engineering approach, which allows for enhanced depth of field and for the recovery of 3D information using single snapshots.
Keywords:
MULTICOLOR LOCALIZATION MICROSCOPY
EXTENDED DEPTH
TRACKING
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