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Detecting linear dichroism with atomic resolution
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DOI：10.1038/s41563-026-02606-6.png)
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Abstract
En 中文
X-ray linear dichroism has been pivotal for probing electronic anisotropies, but its inherent limited spatial resolution precludes the atomic-scale investigations of orbital polarization. Here we introduce a versatile electron linear dichroism methodology in scanning transmission electron microscopy that overcomes these constraints. Using electron energy loss spectroscopy with an atomic-sized probe and selecting momentum transfers along two orthogonal directions, we directly visualize orbital occupation at individual atomic columns in real space. Using strained La0.7Sr0.3MnO3 thin films as a model system, we resolve the Mn3d eg orbital polarization with sub-ångström precision. We show that compressive strain stabilizes 3z2–r2 occupation whereas tensile strain favours x2–y2. These results validate our approach against established X-ray measurements, achieving the ultimate single-atomic-column sensitivity. We further demonstrate two optimized signal extraction protocols that adapt to experimental constraints without compromising sensitivity. This generalizable platform opens unique opportunities to study symmetry-breaking phenomena at individual defects, interfaces and in quantum materials where atomic-scale electronic anisotropy governs emergent functionality. An electron linear dichroism method uses electron energy loss spectroscopy with an atomic-sized probe and momentum transfer selection along two orthogonal directions to resolve orbital occupation at individual atomic columns in real space.
Keywords:
electron linear dichroism
atomic-resolution imaging
orbital polarization
scanning transmission electron microscopy
momentum transfer selection
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38.5
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11.5W
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