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Deterministic electron ptychography at atomic resolution

delete2014-02-03
delete52
PRE
AI
A
A.J. D’Alfonso *
A
Andrew J. Morgan
A
Ada W. C. Yan
王
王朋 (Peng Wang)
H
Hidetaka Sawada
A
AI Kirkland
L
Leslie J. Allen
DOI：10.1103/PhysRevB.89.064101delete
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Abstract

Abstract

En 中文
We present a fast deterministic approach to the ptychographic reconstruction of the transmission function of a specimen at atomic resolution. The method is demonstrated using a data set obtained from a cerium dioxide nanoparticle using an aberration-corrected electron microscope and is compared to established approaches to ptychography. The method is based on the solution of an overdetermined set of linear equations, and is computationally efficient and robust to measurement noise. The set of linear equations is efficiently solved using the conjugate gradient least squares method implemented using fast Fourier transforms.
Keywords:
PRIMARY-WAVE FIELDS
PHASE RETRIEVAL
DIFFRACTION
ALGORITHM
RECONSTRUCTION
MICROSCOPY
AMPLITUDE
IMAGE
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Journal

Physical Review B cover
Physical Review B
IF:
3.7
Papers:
15.4W
Citations:
41.0W

Organization

J
jeol ltd
Scholars:
350
Papers: 395
Citations: 2
N
nanjing university
Scholars:
7.7W
Papers: 5.6W
Citations: 87
U
university of oxford
Scholars:
9.7W
Papers: 8.6W
Citations: 137
U
university of melbourne
Scholars:
5.7W
Papers: 5.4W
Citations: 69
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