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Diagnosis and formulation of subcell properties based on absolute electroluminescence measurements and its application on two types of InGaP/GaAs/InGaAs triple-junction solar cells
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DOI：10.1016/j.solmat.2026.114366.png)
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Abstract
En 中文
• Detailed description for integrating-sphere based absolute EL measurement. • Complete formulas from absolute EL spectra to dark/light subcell J-V curves. • A comparative characteristics diagnosis on two IMM-3JSCs (w/and w/o MQWs). • Propose optimization strategies for further device design and fabrication.
Keywords:
absolute electroluminescence
triple-junction solar cells
subcell properties
integration sphere
quantum well structures
Journal
IF:
6.3
Papers:
1.2W
Citations:
3.6W
Organization
Cited Papers