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Dielectric Sensing using T-matched RAIN RFID Tags
DOI:10.1109/RFID58307.2023.10178643.png)
摘要
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In this paper, we show how measurement of backscattered signal from commercial off-the-shelf RAIN (passive UHF) RFID tags attached to dielectric materials can be used for reliable measurement of dielectric properties of those materials. The method is robust, in that the tags can be generic and do not need to be specially designed or calibrated. The directly measured quantity is the frequency of backscatter (POTR) peak resonance, from which effective dielectric permittivity can be extracted. We show that it is almost independent of tag type used for measurement. Our approach can differentiate between at least four different types of dielectrics that we used in testing. One possible application of this sensing technique is identification for sorting items in recycling and sustainability use cases, such as plastics.
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