Diffraction enhanced imaging: a simple model

Peiping Zhu

doi:10.1088/0022-3727/39/19/004

2006-09-18

PRE

DOI：10.1088/0022-3727/39/19/004

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摘要

En 中文

Based on pinhole imaging and conventional x-ray projection imaging, a more general DEI (diffraction enhanced imaging) equation is derived using simple concepts in this paper. Not only can the new DEI equation explain all the same problems as with the DEI equation proposed by Chapman, but also some problems that cannot be explained with the old DEI equation, such as the noise background caused by small angle scattering diffracted by the analyser.

Keyword:

COMPUTED-TOMOGRAPHY

REFRACTION

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期刊

Journal of Physics D-Applied Physics

IF:

3.2

论文数:

2.6W

被引数:

4.9W

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