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Diffraction tomography without phase information
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AI
DOI：10.1364/OL.27.001890.png)
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摘要
En 中文
A modified form of diffraction tomography is presented in which measurements of the phase of the scattered field are replaced with measurements of the intensity on two planes beyond the scatterer. The new method is illustrated by an example. (C) 2002 Optical Society of America.
期刊
IF:
3.3
论文数:
4.0W
被引数:
7.6W
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