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Dispersed reference interferometry

delete2013-01-01
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PRE
AI
H
Haydn Martin
X
Xiangqian Jiang *
DOI:10.1016/j.cirp.2013.03.104delete
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摘要

摘要

En 中文
Dispersed reference interferometry (DRI) is a potentially useful technique for applications such as absolute displacement, surface topography and film thickness measurement. A bulk optic implementation of a short coherence dispersed reference interferometer is described with the chromatic dispersion applied using two matched transmission gratings in one arm. Such an interferometer can provide absolute knowledge of position by tracking a symmetrical fringe pattern produced by a spectrometer. An operating principle is presented and validation provided through empirical data from optical apparatus. We present experimental results for the resolution, linearity and repeatability of the investigated interferometer apparatus. (C) 2013 CIRP.
Keyword:
Interferometry
Measuring instrument
Surface
Dimensional
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期刊

C
CIRP Annals and Manufacturing Technology
IF:
3.6
论文数:
3.4K
被引数:
1.3W

机构

U
University of Huddersfield
学者数:
3.0K
论文数: 3.2K
被引数: 3.6K
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