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DNA alignment and characterization

delete2003-04-01
delete12
PRE
AI
C
Caiying Yang *
W
W. Yang
D
D. Moses
D
David B. Morse
A
A. J. Heeger
DOI：10.1016/S0379-6779(02)01179-7delete
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Abstract

Abstract

En 中文
We have oriented DNA (complexed with surfactant) films by tensile drawing in order to reduce structural disorder and to investigate their anisotropic transport and opto-electronic properties. The oriented DNA films were characterized by X-ray diffraction and transient photoconductivity. The oriented DNA-surfactant films exhibit structural polymorphism, with structures similar to those found in neat DNA fibers. Initial transient photoconductivity measurements indicate disorder limited transport along the stacked base-pairs.
Keywords:
DNA alignment
X-ray diffraction
photoconductivity

Journal

Synthetic Metals cover
Synthetic Metals
IF:
4.6
Papers:
1.4W
Citations:
1.3W

Organization

No organization information available