Efficient knowledge distillation with emphasized Radon features for wafer bin map classification

doi:10.1016/j.engappai.2026.115299

2026-07-09

PRE

DOI：10.1016/j.engappai.2026.115299

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摘要

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• 评估图像和Radon变换域中的现代深度学习架构。 • 强调的Radon模式抑制随机缺陷并突出系统性模式。 • 多标签知识蒸馏使紧凑型学生模型得以实现，并进行了权衡分析。

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Engineering Applications of Artificial Intelligence

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samsung electronics

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pohang university of science and technology

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