Efficiently measuring a quantum device using machine learning (vol 5, 79, 2019)2019-11-080 OA AI DD. T. Lennon HH. Moon LLeon C. Camenzind LLiuqi Yu DDominik M. Zumbühl GG. Andrew D. Briggs MMichael A. Osborne EE. A. Laird NNatalia Ares DOI:10.1038/s41534-019-0214-3原文链接分享收藏查看原文摘要 En