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Electron holographic tomography
DOI:10.1016/j.cossms.2013.05.002.png)
摘要
En 中文
The exact knowledge about intrinsic electrostatic potentials and in particular their three-dimensional distribution at the nanometer scale is a key prerequisite for understanding the solid state properties. Electron holographic tomography (EHT), the combination of off-axis holography with tomography in the transmission electron microscope, provides a unique access to this information. We review the development and application of automated EHT to reconstruct 3D potentials in nanostructures such as the mean inner potential of a material or the diffusion potential across p-n junctions in semiconductors. We also discuss future challenges of the 3D reconstruction of electric crystal potentials at atomic resolution and magnetostatic fields as well as ways to overcome present limitations of the method. (C) 2013 Elsevier Ltd. All rights reserved.
Keyword:
Nanostructure
Hologram
Tomogram
Phase image
Electrostatic potential
Magnetostatic field
3D morphology
p-n Junction
Semiconductor
期刊
IF:
13.4
论文数:
1.3K
被引数:
5.5K

