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Energy dissipation in tapping-mode atomic force microscopy
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DOI：10.1063/1.121434.png)
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A method is presented to measure the energy dissipated by the tip-sample interaction in tapping-mode atomic force microscopy (AFM). The results show that if the amplitude of the cantilever is held constant, the sine of the phase angle of the driven vibration is then proportional to changes in the tip-sample energy dissipation. This means that images of the cantilever phase in tapping-mode AFM are closely related to maps of dissipation. The maximum dissipation observed for a 4 N/m cantilever with an initial amplitude of 25 nm tapping on a hard substrate at 74 kHz is about 0.3 pW. (C) 1998 American Institute of Physics.
Keyword:
CANTILEVERS
期刊
IF:
3.6
论文数:
10.4W
被引数:
17.8W
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