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Evaluating Depth Sectioning and its Systematic Errors in Multislice Ptychography
DOI:10.1093/mam/ozaf048.043.png)
摘要
En
期刊
IF:
3
论文数:
1.4K
被引数:
6.2K
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引用论文
Electron ptychography achieves atomic-resolution limits set by lattice vibrations电子照相达到了由晶格振动设定的原子分辨率极限
Science
IF0
Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography通过倾斜耦合的多片电子像衬显微镜技术实现的亚纳米深度分辨率和单个掺杂剂可视化
NATURE COMMUNICATIONS
IF15.7
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