arrow
返回

Exploiting Feature Layer for Read Reference Voltage Optimization on 3-D NAND Flash Memory

delete2024-02-01
delete2
PRE
AI
D
Debao Wei
Z
Zhelong Piao
M
Ming Liu
Y
Yanlong Zeng
H
Hua Feng
L
Liyan Qiao *
X
Xiyuan Peng
DOI:10.1109/TCE.2023.3332888delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
Three-dimensional (3D) NAND flash memories have been widely employed as non-volatile memory mediums in modern consumer electronics. However, the adoption of 3D structures also induces complex reliability issues in flash memories. Read reference voltage (RRV) optimization is regarded as one of the key fundamental techniques to enhance the reliability of flash-based storage. Conventional strategies generally utilize the samples extracted layer-by-layer from the target flash block to estimate the optimal read voltage, resulting in significant read latency. In this work, we propose utilizing the feature layer concept to diminish the sampling overhead caused by RRV optimization, where the optimal read voltages at block granularity (BGVI) or layer granularity (LGVI) are inferred through samples extracted from the feature layer. We further develop a noise-reduction optimal read voltage determination algorithm (NRVD) to overcome the measurement noise existing in samples extracted from the feature layers. Experiments on real flash chips demonstrate that the proposed design can infer the optimal read voltages with considerable accuracy and decrease the read count by more than 50% compared with the existing RRV optimization designs.
Keyword:
Ash
Threshold voltage
Voltage measurement
Optimization
Feature extraction
Three-dimensional displays
Consumer electronics
3D NAND flash memory
optimal read voltage
cross-layer variation

期刊

IEEE Transactions on Consumer Electronics 封面图
IEEE Transactions on Consumer Electronics
IF:
10.9
论文数:
5.3K
被引数:
6.8K

机构

H
harbin institute of technology
学者数:
8.0W
论文数: 6.6W
被引数: 66
引用论文

引用论文

Involution calcique d’un cystadénome séreux浆液性囊腺瘤的钙化性退化
err2006-07-01
err0
PREAI
errClaire Charpignon; Olivier Corcos; Marie-Pierre Vullierme; Pascal Hammel; Philippe Ruszniewski; Philippe Lévy
err分享
err收藏
err
IF0
err
err0
PREAI
err
err分享
err收藏
err分享
err收藏
Bichromatic and trichromatic manipulation of spontaneous emission in a three-level Λ system
err2006-04-01
err0
PREAI
errXiang-ming Hu; Qing Xu; Jing-yan Li; Xiao-xia Li; Wen-xing Shi; Xiu Zhang
err分享
err收藏
Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives
err2017-09-01
err253
errOAAI
errCai, Yu; Ghose, Saugata; Haratsch, Erich F.; Luo, Yixin; Mutlu, Onur
err分享
err收藏
RBER-Aware Lifetime Prediction Scheme for 3D-TLC NAND Flash Memory
err2019-01-01
err28
errOAAI
errMa, Ruixiang; Wu, Fei; Zhang, Meng; Lu, Zhonghai; Wan, Jiguang; Xie, Changsheng
err分享
err收藏
err分享
err收藏
学者 查看更多内容