返回
Fast Spectrum Measurements Using Optical Computing
DOI:10.1109/JSTQE.2022.3201573.png)
摘要
En 中文
Traditional spectrometers are too slow for the continuous real-time measurement of rapidly varying spectrum. Dispersive Fourier transformation (DFT) technology replaces diffraction grating and detector array in traditional spectrometers with dispersive elements and photodiodes, and therefore reaches MHz-level spectral capture rate. In addition, frequency-resolved optical gating (FROG) and spectral phase interferometry for direct electric-field reconstruction (SPIDER) are also important ultrafast spectroscopy technologies in relevant fields. However, these approaches have to use mode-locked pulses as probe light, which may cause damages to some samples due to high peak power. Therefore, the requirement for light source restricts the scope of these technologies' applications. Here, we report a general technique using optical computing for fast spectrum measurements, to overcome the bottleneck of light source in existing ultrafast spectroscopy measurement technologies. The proposed method has no strict requirement on the probe light. It means the common light source could also be applied for fast real-time spectroscopic measurements. In experiments, CW signals with four different optical spectra have been measured at capture speed of 1MHz respectively. The proposed method can overcome the limitations of existing ultrafast spectroscopy technologies in light source, and therefore provide a powerful tool for investigating rapid transient phenomena in many applications.
Keyword:
Dispersion
Optical variables measurement
High-speed optical techniques
Optical pulses
Ultrafast optics
Velocity measurement
Optical interferometry
Dispersive medium
fast single-shot spectrum measurements
optical computing
期刊
I
IF:
5.1
论文数:
5.6K
被引数:
1.2W
机构
引用论文
Electronic and optoelectronic properties of van der Waals heterostructure based on graphene-like GaN, blue phosphorene, SiC, and ZnO: A first principles study基于类石墨烯GaN,蓝色磷烯,SiC和ZnO的范德华异质结构的电子和光电性质: 第一性原理研究
Spectral phase interferometry for direct electric-field reconstruction of ultrashort optical pulses
OPTICS LETTERS
IF3.3

