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Fermi surface tomography
DOI:10.1038/s41467-022-31841-z.png)
摘要
En 中文
Fermi surfaces are essential for predicting, characterizing and controlling the properties of crystalline metals and semiconductors. Angle-resolved photoemission spectroscopy (ARPES) is the only technique directly probing the Fermi surface by measuring the Fermi momenta (k(F)) from energy- and angular distribution of photoelectrons dislodged by monochromatic light. Existing apparatus is able to determine a number of k(F) -vectors simultaneously, but direct high-resolution 3D Fermi surface mapping remains problematic. As a result, no such datasets exist, strongly limiting our knowledge about the Fermi surfaces. Here we show that using a simpler instrumentation it is possible to perform 3D-mapping within a very short time interval and with very high resolution. We present the first detailed experimental 3D Fermi surface as well as other experimental results featuring advantages of our technique. In combination with various light sources our methodology and instrumentation offer new opportunities for high-resolution ARPES in the physical and life sciences. The Fermi surface is related to the energy distribution of electrons in a solid, and governs physical properties of metals and semiconductors. A new type of angle-resolved photoemission spectroscopy, probing the Fermi surface and combining short recording time with high resolution, is now presented.
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期刊
IF:
15.7
论文数:
9.6W
被引数:
111.8W
机构
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