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Field-enhanced scanning optical microscope
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DOI：10.1364/OL.25.000631.png)
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We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a p-polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip-sample distance, yielding the ultrahigh vertical resolution reached in the images. (C) 2000 Optical Society of America.
Keyword:
METALLIC PROBE TIP
MODE
SPECTROSCOPY
RESOLUTION
IMAGES
FIBER
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3.3
论文数:
4.0W
被引数:
7.6W
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